{"id":362,"date":"2014-07-23T16:11:47","date_gmt":"2014-07-23T07:11:47","guid":{"rendered":"http:\/\/tadano.bk.tsukuba.ac.jp\/?page_id=362"},"modified":"2019-05-04T19:03:37","modified_gmt":"2019-05-04T10:03:37","slug":"%e5%8f%aa%e9%87%8e-%e5%8d%9a","status":"publish","type":"page","link":"http:\/\/power.bk.tsukuba.ac.jp\/?page_id=362","title":{"rendered":"\u53ea\u91ce \u535a"},"content":{"rendered":"<p>&nbsp;<\/p>\n<h2>\u53ea\u91ce\u3000\u535a\u3000\uff08\u305f\u3060\u306e\u3000\u3072\u308d\u3057\uff09<\/h2>\n<p><img loading=\"lazy\" class=\"alignright wp-image-456 size-full\" src=\"http:\/\/power.bk.tsukuba.ac.jp\/wp-content\/uploads\/2014\/07\/e684c0763ed7d1e493d00e0b87f4d374.jpg\" alt=\"\u53ea\u91ce\" width=\"145\" height=\"158\" \/> <strong>\u5c45\u5ba4\uff1a<\/strong><\/p>\n<p><strong>E-mail\uff1a<\/strong><\/p>\n<p><strong>TEL\uff1a<\/strong><\/p>\n<p><strong>\u5c02\u9580\u5206\u91ce\uff1a<\/strong>\u534a\u5c0e\u4f53\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9, \u96fb\u529b\u5909\u63db\u56de\u8def<\/p>\n<p><strong>\u6240\u5c5e:\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u7814\u7a76\u5ba4<\/strong><\/p>\n<p><strong>\u5b66\u4f4d\uff1a<\/strong>\u3000\u5de5\u5b66\u535a\u58eb<\/p>\n<h3><strong>\u7d4c\u6b74<\/strong><\/h3>\n<ul>\n<li>1980\u5e743\u6708\u3000 \u3000\u3000\u3000\u3000\u3000\u3000\u6771\u5317\u5927\u5b66\u5927\u5b66\u9662\u5de5\u5b66\u7814\u7a76\u79d1\u3000\u4fee\u4e86<\/li>\n<li>1980\u5e744\u6708\uff5e2013\u5e743\u6708\u3000\uff08\u682a\uff09\u8c4a\u7530\u4e2d\u592e\u7814\u7a76\u6240<\/li>\n<li>2013\u5e744\u6708\uff5e2019\u5e743\u6708\u3000\u3000\u7b51\u6ce2\u5927\u5b66\u3000\u6559\u6388<\/li>\n<li>2019\u5e744\u6708\u301c\u3000\u3000\u3000\u3000\u3000 \u00a0\u3000\u540d\u53e4\u5c4b\u5927\u5b66\u3000\u7279\u4efb\u6559\u6388\u3001\u3000\u7b51\u6ce2\u5927\u5b66\u3000\u5ba2\u54e1\u6559\u6388<\/li>\n<\/ul>\n<h3><strong>\u8ad6\u6587\u7b49<\/strong><\/h3>\n<h5>2017\u5e74<\/h5>\n<ul>\n<li>\u5b89\u4fca\u5091\u3001\u751f\u4e95\u6b63\u8f1d\u3001\u5ca1\u672c\u5927\u3001\u77e2\u91ce\u88d5\u53f8\u3001\u53ea\u91ce\u535a\u3001\u5ca9\u5ba4\u61b2\u5e78\u3001\u2018\u2018Unclamped Inductive Switching\u8a66\u9a13\u306b\u3088\u308b4H-SiC MOSFET\u306e\u6700\u5927\u63a5\u5408\u6e29\u5ea6\u306e\u8a55\u4fa1\u201d\u3001\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8cC\u3001137\u5dfb 2\u53f7 C\u5206\u518a\u3001pp.216-221 (2017).<\/li>\n<li>\u4e39\u7fbd\u7ae0\u96c5\u3001\u5c0f\u5cf6\u9818\u592a\u3001\u6728\u6751\u53cb\u5247\u3001\u7b39\u8c37\u5353\u4e5f\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3001\u201dSiC\uff0dMOSFET\u306e\u9006\u56de\u5fa9\u640d\u5931\u4f4e\u6e1b\u306b\u95a2\u3059\u308b\u5b9f\u9a13\u7684\u8003\u5bdf\u201d\u3001\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8cC\u3001137\u5dfb 2\u53f7 C\u5206\u518a\u3001pp,208-215 (2017).<\/li>\n<\/ul>\n<h5>2016\u5e74<\/h5>\n<ul>\n<li>\u4e39\u7fbd \u7ae0\u96c5, \u4eca\u6fa4 \u5b5d\u5247, \u6728\u6751 \u53cb\u5247, \u7b39\u8c37 \u5353\u4e5f, \u78ef\u90e8 \u9ad8\u7bc4, \u53ea\u91ce \u535a &#8220;SiC-MOSFET\u306e\u96fb\u6d41\u30bb\u30f3\u30b5\u6a5f\u80fd\u3092\u7528\u3044\u305f\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u5236\u5fa1\u56de\u8def\u201d\u3000\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8cD\u3000Vol.136\u3001 No.2\u3001pp145-151\u3001(2016)<\/li>\n<\/ul>\n<h5>2015\u5e74<\/h5>\n<ul>\n<li>Tomoyuki Shoji1, Akitaka Soeno, Hiroaki Toguchi, Sachiko Aoi, Yukihiko Watanabe and Hiroshi Tadano\u3000\u201dTheoretical analysis of short-circuit capability of SiC power MOSFETs\u201d\u3000JJAP 54, 04DP03 (2015)<\/li>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano &#8220;Observation and Analysis of Neutron-Induced Single-Event Burnout in Silicon Power Diodes&#8221; IEEE TPE, 30, 5, pp.2472-2480, (2015)<\/li>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano &#8220;Analysis of neutron-induced single-event burnout in SiC power MOSFETs&#8221; Microelectronics Reliability, 55, pp.1517-1521, (2015)<\/li>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano &#8220;Cosmic Ray Neutron Induced Single-event Burnout in Power Devices&#8221;,IET Power Electronics, Vol.8, Issue 12, pp.2315-2321, (2015)<\/li>\n<\/ul>\n<h5>2014\u5e74<\/h5>\n<ul>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano\u00a0 \u201dExperimental and simulation studies of neutron-induced single-event burnout in SiC power diodes&#8221; JJAP 53, 04EP03 (2014).<\/li>\n<li>T.Shoji, S.Nishida, K.Hamada and H.Tadano &#8220;Observation and Analysis of Neutron-Induced Single-Event Burnout in Silicon Power Diode&#8221; IEEE Xplore Digital Library, (2014)<\/li>\n<\/ul>\n<h3><strong>\u767a\u8868\u7b49<\/strong><\/h3>\n<h5>2017\u5e74<\/h5>\n<ul>\n<li>Zijin He, Long Zhang, Takanori Isobe and Hiroshi Tadano &#8220;Dynamic Performance Improvement of Single-Phase STATCOM with Drastically Reduced Capacitance&#8221; IFEEC2017, 2017.<\/li>\n<li>Rene Barrera-Cardenas, Jiantao Zhang, Takanori Isobe and Hiroshi Tadano &#8220;Influence of CCM and DCM operation on converter Efficiency and Power Density of a Single-Phase Grid-Tied Inverter&#8221; IFEEC2017, 2017.<\/li>\n<li>Rene Barrera-Cardenas, Jiantao Zhang, Takanori Isobe and Hiroshi Tadano \u201dA Comparative Study of Output Filter Efficiency and Power Density in Single-Phase Grid-Tied Inverter Using Continuous or Discontinous Current Mode Operations&#8221; EPE2017, 2017.<\/li>\n<li>\u9d28\u5fd7\u7530\u3001\u98ef\u5cf6\u3001\u78ef\u90e8\u3001\u53ea\u91ce\u3000\u201dSuperjunction-MOSFET\u3092\u9069\u7528\u3057\u305fZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u6607\u5727\u52d5\u4f5c\u306b\u4f34\u3046\u640d\u5931\u306e\u89e3\u6790\u201d\u3000\u96fb\u6c17\u5b66\u4f1a\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\u30fb\u30e2\u30fc\u30bf\u30c9\u30e9\u30a4\u30d6\u5408\u540c\u7814\u7a76\u4f1a\u3001\u548c\u6b4c\u5c71\u30012017.<\/li>\n<li>JianTao Zhang, Rene A. Barrera-Cardenas\u0003, Takanori Isobe\u0003 and Hiroshi Tadano &#8220;Trapezium Current Mode (TPCM) Boundary Operation for Single Phase Grid-tied Inverter&#8221; ECCE2017, 2017.<\/li>\n<li>Takanori Isobe, Hiroshi Tadano, Zijin He, Yang Zou &#8220;Control of Solid-State-Transformer for Minimized Energy Storage Capacitors&#8221; ECCE2017, 2017.<\/li>\n<li>JianTao Zhang, Rene A. Barrera-Cardenas\u2217, Takanori Isobe\u2217 and Tadano Hiroshi &#8220;Evaluation of Trapezium Current Mode in Comparison to the Discontinuous Current Mode for Single Phase Grid-tied Inverter&#8221; IECON2017, 2017.<\/li>\n<\/ul>\n<h5>2016\u5e74<\/h5>\n<ul>\n<li>\u98ef\u5d8b\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dSiC-MOSFET\u3092\u7528\u3044\u305fZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308b\u30dc\u30c7\u30a3\u30fc\u30c0\u30a4\u30aa\u30fc\u30c9\u306e\u7121\u901a\u96fb\u904b\u8ee2\u306b\u95a2\u3059\u308b\u691c\u8a0e\u201d\u3000\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\u7814\u7a76\u4f1a\u30002016.<\/li>\n<li>J.Ann, M.Namai, D.Okamoto, H.Yano, H.Tadano, N.Iwamuro,\u3000\u201dElectrothermal Evaluation of SiC MOSFETs during Unclamped Inductive Switching\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u751f\u4e95\u6b63\u8f1d\u3001\u5b89\u4fca\u5091\u3001\u5ca1\u672c\u5927\u3001\u77e2\u91ce\u88d5\u53f8\u3001\u53ea\u91ce\u535a\u3001\u5ca9\u5ba4\u61b2\u5e78\u3000\u201dSiC-MOSFET\u306eUIS\u8010\u91cf\u8a55\u4fa1\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u5c0f\u5cf6\u9818\u592a\u3001\u4e39\u7fbd\u7ae0\u96c5\u3001\u5c71\u7530\u9686\u5f18\u3001\u7b39\u8c37\u5353\u4e5f\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dSiC-MOSFET\u30dc\u30c7\u30a3\u30fc\u30c0\u30a4\u30aa\u30fc\u30c9\u306e\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u77ed\u7e2e\u306b\u3088\u308b\u30ea\u30ab\u30d0\u30ea\u640d\u5931\u4f4e\u6e1b\u52b9\u679c\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u5f35\u9f8d\u3001\u98ef\u5cf6\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3001\u5ddd\u6ce2\u9756\u5f66\u3001\u5bfa\u5712\u52dd\u5fd7\u3000\u201d\u30e2\u30b8\u30e5\u30e9\u30fc\u30fb\u30de\u30eb\u30c1\u30ec\u30d9\u30eb\u69cb\u6210\u30c8\u30e9\u30f3\u30b9\u30ec\u30b9STATCOM\u306e\u30b3\u30f3\u30c7\u30f3\u30b5\u306e\u5c0f\u578b\u5316\u306b\u95a2\u3059\u308b\u691c\u8a0e\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u9673\u5049\u592b\u3001\u98ef\u5cf6\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3001\u5ddd\u6ce2\u9756\u5f66\u3001\u5bfa\u5712\u52dd\u5fd7\u3000\u201dDual Active Bridge\u30b3\u30f3\u30d0\u30fc\u30bf\u306e\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u6700\u9069\u5316\u306b\u95a2\u3059\u308b\u5b9f\u9a13\u7684\u691c\u8a0e\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u6e21\u908a\u76f4\u4e5f\u3001\u5927\u6fa4\u9806\u3001\u53ea\u91ce\u535a\u3001\u78ef\u90e8\u9ad8\u7bc4\u3000\u201d\u975e\u63a5\u89e6\u7d66\u96fb\u30b7\u30b9\u30c6\u30e0\u306b\u304a\u3051\u308b\u76f4\u5217\u88dc\u511f\u56de\u8defGCSC\u306e\u9069\u7528\u52b9\u679c\u306b\u95a2\u3059\u308b\u691c\u8a0e\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u5d8b\u7530\u9686\u4e00\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3001\u5ca9\u5ba4\u61b2\u5e78\u3000\u201dSiC-MOSFET\u306b\u3088\u308b\u7121\u30a2\u30fc\u30af\u4f4e\u30ce\u30a4\u30ba\u958b\u9589\u5668\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>\u98ef\u5d8b\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201d\uff51\uff0dZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308bMOSFET\u3092\u7528\u3044\u305f\u30c0\u30a4\u30aa\u30fc\u30c9\u306e\u640d\u5931\u4f4e\u6e1b\u306b\u95a2\u3059\u308b\u5b9f\u9a13\u7684\u691c\u8a0e\u201d\u3000\u5e73\u621028\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30012016.<\/li>\n<li>Thilak S., R.Iijima, T,Isobe, H,Tadano &#8220;Improved Impedance Source Inverter for Hybrid\/Electric Vehicle Application with Continuous Conduction Operation&#8221; APEC2016, 2016.<\/li>\n<li>\u53ea\u91ce\u535a\u3000\u201d\u81ea\u52d5\u8eca\u7528\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u306e\u73fe\u72b6\u3068\u4eca\u5f8c\u201d\u3000\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b9f\u88c5\u5b66\u4f1a\u7b2c\uff13\uff10\u56de\u6625\u5b63\u8b1b\u6f14\u5927\u4f1a\u30002016.<\/li>\n<\/ul>\n<h5>2015\u5e74<\/h5>\n<ul>\n<li>\u98ef\u5d8b\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308b\u4e0a\u4e0b\u77ed\u7d61\u6642\u306e\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u30d1\u30bf\u30fc\u30f3\u306b\u95a2\u3059\u308b\u691c\u8a0e\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30002015.<\/li>\n<li>\u4eca\u6fa4\u5b5d\u5247\u3001\u4e39\u7fbd\u7ae0\u96c5\u3001\u5165\u6c5f\u5c06\u55e3\u3001\u5c71\u672c\u660c\u5f18\u3001\u5ddd\u539f\u82f1\u6a39\u3001\u6728\u6751\u53cb\u5247\u3001\u7b39\u8c37\u5353\u4e5f\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dSiC-MOSFET\u306e\u96fb\u6d41\u30bb\u30f3\u30b9\u6a5f\u80fd\u3092\u7528\u3044\u305f\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u5236\u5fa1\u56de\u8def\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\u30002015.<\/li>\n<li>\u6c88\u51cc\u92d2\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dSiC-MOSFET\u3092\u7528\u3044\u305fDC-DC\u30b3\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308b\u30b2\u30fc\u30c8\u62b5\u6297\u53ca\u3073\u5916\u4ed8SiC-SBD\u306e\u6709\u7121\u3068\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u640d\u5931\u306e\u95a2\u4fc2\u8a55\u4fa1\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\u30002015.<\/li>\n<li>\u98ef\u5d8b\u7adc\u53f8\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201dZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308b\u4e0a\u4e0b\u77ed\u7d61\u65b9\u5f0f\u3068\u534a\u5c0e\u4f53\u7d20\u5b50\u306e\u9055\u3044\u306b\u3088\u308b\u767a\u751f\u640d\u5931\u306e\u6bd4\u8f03\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\u30002015.<\/li>\n<li>\u5c71\u7530\u5eb8\u4ecb\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u5d8b\u7530\u9686\u4e00\u3001\u53ea\u91ce\u535a\u3000\u201d\u30c0\u30a4\u30aa\u30fc\u30c9\u6574\u6d41\u56de\u8def\u3068\u76f4\u5217\u7121\u52b9\u96fb\u529b\u88dc\u511f\u56de\u8def\u3092\u7d44\u307f\u5408\u308f\u305b\u305f\u6c38\u4e45\u78c1\u77f3\u540c\u671f\u767a\u96fb\u6a5f\u5411\u3051\u6574\u6d41\u56de\u8def\u306e\u640d\u5931\u5206\u6790\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\u30002015.<\/li>\n<li>\u5965\u7530\u4e00\u771f\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3001\u5ca9\u5ba4\u61b2\u5e78\u3000\u201d\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u3092\u6700\u5c0f\u3068\u3059\u308b\u76f8\u88dc\u578b\u30a4\u30f3\u30d0\u30fc\u30bf\u53ca\u3073\u305d\u306e\u30b2\u30fc\u30c8\u99c6\u52d5\u56de\u8def\u306e\u691c\u8a0e\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\u30002015.<\/li>\n<li>\u4e39\u7fbd\u7ae0\u96c5\u3001\u5c71\u672c\u660c\u5f18\u3001\u5165\u6c5f\u5c06\u55e3\u3001\u4eca\u6fa4\u5b5d\u5247\u3001\u5ca9\u6751\u525b\u5b8f\u3001\u7b39\u8c37\u5353\u4e5f\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201d\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u5236\u5fa1\u6a5f\u80fd\u3092\u5185\u8535\u3057\u305fSiC-MOSFET\u30b2\u30fc\u30c8\u30c9\u30e9\u30a4\u30d0\u201d\u3000\u5e73\u621027\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\u30002015.<\/li>\n<li>Y. Yamada, T. Isobe, R. Shimada and H. Tadano &#8220;Efficiency Evaluation of Rectifier System for PMSG with High Efficient Series Reactive Compensator&#8221;, ICEMS2015, 2015<\/li>\n<li>R. Iijima, T. Isobe, H. Tadano &#8220;Loss Comparison of Z-source Inverter from the Perspective of Short-through Mode Implementation and Type of Switching Device&#8221;, IFEEC2015, 2015<\/li>\n<li>R. Iijima, T. Isobe, H. Tadano &#8220;Investigation of Eliminating Free-wheeling Diode Conduction of Z-source Inverter using SiC-MOSFET&#8221;, IECON2015, 2015<\/li>\n<li>A. Niwa, T. Imazawa, T. Kimura, T, Sasaya, T, Isobe and H. Tadano &#8220;Novel Dead Time Controlled Gate Driver Using the Current Sensor of SiC-MOSFET&#8221;, IECON2015, 2015<\/li>\n<li>\u5f35\u5263\u97dc\u3001\u78ef\u90e8\u9ad8\u7bc4\u3001\u53ea\u91ce\u535a\u3000\u201d\u96fb\u6d41\u4e0d\u9023\u7d9a\u30e2\u30fc\u30c9\u7cfb\u7d71\u9023\u643a\u30a4\u30f3\u30d0\u30fc\u30bf\u3068\u305d\u306e\u30bd\u30d5\u30c8\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u5316\u306e\u691c\u8a0e\u201d\u3001\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a\u7b2c211\u56de\u5b9a\u4f8b\u7814\u7a76\u4f1a\u30012015<\/li>\n<\/ul>\n<h5>2014\u5e74<\/h5>\n<ul>\n<li>\u53ea\u91ce\u535a\u3000\u201dSi\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u4fe1\u983c\u6027\u201d\u3000\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u3000\u7b2c1\u56de\u7814\u7a76\u4f1a\u30002014\u5e747\u670830\u65e5<\/li>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano, &#8220;Cosmic Ray Induced Single-Event Burnout in Power Devices&#8221; ISPS&#8217;14, 2014.<\/li>\n<li>T. Shoji, A. Soeno, H. Taguchi, S. Aoi, Y. Watanabe and H. Tadano, &#8220;Short-circuit capability of SiC power MOSFETs&#8221;, SSDM2014, 2014.<\/li>\n<li>\u4e39\u7fbd\u7ae0\u96c5\uff0c\u4eca\u6fa4\u5b5d\u5247\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u53ea\u91ce\u3000\u535a\u3000\u201dSiC-MOSFET\u306e\u96fb\u6d41\u30bb\u30f3\u30b9\u6a5f\u80fd\u3092\u7528\u3044\u305f\u30c7\u30c3\u30c9\u30bf\u30a4\u30e0\u5236\u5fa1\u56de\u8def\u306e\u63d0\u6848\u201d\u3000\u96fb\u6c17\u5b66\u4f1a\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\u5bb6\u96fb\u6c11\u751f\u81ea\u52d5\u8eca\u5408\u540c\u7814\u7a76\u4f1a\uff0c2014.<\/li>\n<li>\u98ef\u5d8b\u7adc\u53f8\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u53ea\u91ce\u535a\u3000\u201dZ\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306b\u304a\u3051\u308bSiC-MOSFET\u306e\u52d5\u4f5c\u306b\u95a2\u3059\u308b\u691c\u8a0e\u201d\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a\u7b2c206\u56de\u5b9a\u4f8b\u7814\u7a76\u4f1a\uff0c2014.<\/li>\n<li>\u5c71\u7530\u5eb8\u4ecb\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u53ea\u91ce\u535a\u3000\u201d\u6c38\u4e45\u78c1\u77f3\u767a\u96fb\u6a5f\u306e\u305f\u3081\u306e\u76f4\u5217\u7121\u52b9\u96fb\u529b\u88dc\u511f\u56de\u8def\u306e\u691c\u8a0e\u201d\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a\u7b2c206\u56de\u5b9a\u4f8b\u7814\u7a76\u4f1a\uff0c2014.<\/li>\n<li>\u6c88\u51cc\u92d2\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u53ea\u91ce\u535a\u3000\u201dSiC\u3000MOSFET\u3092\u7528\u3044\u305f\u9ad8\u5468\u6ce2DC-DC\u30b3\u30f3\u30d0\u30fc\u30bf\u306e\u52b9\u7387\u3068\u30ce\u30a4\u30ba\u306e\u8a55\u4fa1\u201d\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a\u7b2c206\u56de\u5b9a\u4f8b\u7814\u7a76\u4f1a\uff0c2014.<\/li>\n<li>\u5965\u7530\u4e00\u771f\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u5ca9\u5ba4\u61b2\u5e78\uff0c\u53ea\u91ce\u535a\u3000\u201d\u76f8\u88dc\u578b\u30a4\u30f3\u30d0\u30fc\u30bf\u5411\u3051\u7e26\u578bSiC-pMOSFET\u306e\u691c\u8a0e\u201d\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a\u7b2c206\u56de\u5b9a\u4f8b\u7814\u7a76\u4f1a\uff0c2014.<\/li>\n<\/ul>\n<h5>2013\u5e74<\/h5>\n<ul>\n<li>T. Shoji, S. Nishida, K. Hamada and H. Tadano &#8220;Neutron Induced Single-Event Burnout in SiC Power Diode&#8221; Extended Abstracts of 2013 SSDM, pp.954-955, (2013).<\/li>\n<\/ul>\n<h3>\u53d7\u8cde<\/h3>\n<ul>\n<li>\u96fb\u6c17\u5b66\u4f1a\u3000\u96fb\u6c17\u5b66\u8853\u632f\u8208\u8cde\u9032\u6b69\u8cde\u30002015\u5e745\u670829\u65e5<\/li>\n<\/ul>\n<h3><strong>\u6240\u5c5e\u5b66\u5354\u4f1a<\/strong><\/h3>\n<ul>\n<li>IEEE<\/li>\n<li>\u96fb\u6c17\u5b66\u4f1a<\/li>\n<li>\u96fb\u5b50\u60c5\u5831\u901a\u4fe1\u5b66\u4f1a<\/li>\n<li>\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b66\u4f1a<\/li>\n<li>\u81ea\u52d5\u8eca\u6280\u8853\u4f1a<\/li>\n<li>\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a<\/li>\n<li>\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5b9f\u88c5\u5b66\u4f1a<\/li>\n<\/ul>\n<h3>\u7814\u7a76\u30c6\u30fc\u30de<\/h3>\n<ul>\n<li>\u30d1\u30eb\u30b9\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u7814\u7a76<\/li>\n<li>\u30a4\u30f3\u30d4\u30fc\u30c0\u30f3\u30b9\u30bd\u30fc\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u7814\u7a76<\/li>\n<li>SiC\u3092\u7528\u3044\u305f\u9ad8\u901f\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u56de\u8def\u306e\u7814\u7a76<\/li>\n<li>\u9ad8\u901f\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u306b\u304a\u3051\u308b\u96fb\u6d41\u5206\u5e03\u306e\u7814\u7a76<\/li>\n<\/ul>\n<h3>\u3053\u308c\u307e\u3067\u306e\u7814\u7a76<\/h3>\n<ul>\n<li>\u5316\u5408\u7269\u534a\u5c0e\u4f53\u306e\u7d50\u6676\u6b20\u9665\u306b\u95a2\u3059\u308b\u7814\u7a76<\/li>\n<li>\u9759\u96fb\u8a98\u5c0e\u578b\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u7814\u7a76\u958b\u767a<\/li>\n<li>SiC\u30c7\u30d0\u30a4\u30b9\u306e\u7814\u7a76<\/li>\n<li>GaN\u30c7\u30d0\u30a4\u30b9\u306e\u7814\u7a76<\/li>\n<li>\u30cf\u30a4\u30d6\u30ea\u30c3\u30c9\u81ea\u52d5\u8eca\u7528\u30c0\u30a4\u30aa\u30fc\u30c9\u30fbIGBT\u306e\u7814\u7a76\u958b\u767a<\/li>\n<li>Si\u30a8\u30d4\u30bf\u30ad\u30b7\u30e3\u30eb\u6210\u9577\u306b\u95a2\u3059\u308b\u7814\u7a76<\/li>\n<li>\u534a\u5c0e\u4f53\u30c7\u30d0\u30a4\u30b9\u306e\u30ce\u30a4\u30ba\u8010\u6027\u306b\u95a2\u3059\u308b\u7814\u7a76<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"&nbsp; \u53ea\u91ce\u3000\u535a\u3000\uff08\u305f\u3060\u306e\u3000\u3072\u308d\u3057\uff09 \u5c45\u5ba4\uff1a E-mail\uff1a TEL\uff1a \u5c02\u9580\u5206\u91ce\uff1a\u534a\u5c0e\u4f53\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9, \u96fb\u529b\u5909\u63db\u56de\u8def \u6240\u5c5e:\u3000\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u7814\u7a76\u5ba4 \u5b66\u4f4d\uff1a\u3000\u5de5\u5b66\u535a\u58eb \u7d4c\u6b74 1980\u5e743\u6708\u3000 \u3000\u3000\u3000\u3000\u3000\u3000\u6771 &#8230;","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/362"}],"collection":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=362"}],"version-history":[{"count":98,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/362\/revisions"}],"predecessor-version":[{"id":5283,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/362\/revisions\/5283"}],"wp:attachment":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=362"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}