{"id":5517,"date":"2021-07-10T16:05:32","date_gmt":"2021-07-10T07:05:32","guid":{"rendered":"http:\/\/power.bk.tsukuba.ac.jp\/?page_id=5517"},"modified":"2023-05-09T11:53:36","modified_gmt":"2023-05-09T02:53:36","slug":"2021%e5%b9%b4%e5%ba%a6%e3%81%ae%e7%a0%94%e7%a9%b6%e6%a5%ad%e7%b8%be","status":"publish","type":"page","link":"http:\/\/power.bk.tsukuba.ac.jp\/?page_id=5517","title":{"rendered":"2021\u5e74\u5ea6\u306e\u7814\u7a76\u696d\u7e3e"},"content":{"rendered":"

<\/p>\n

\u8457\u8005\u306b\u4e0b\u7dda<\/span>\u306e\u3042\u308b\u3082\u306e\u306f\u4ed6\u6a5f\u95a2\u6240\u5c5e\u306e\u8457\u8005\u3068\u306e\u5171\u8457\u306e\u3082\u306e\u3067\uff0c\u4e0b\u7dda\u306e\u8457\u8005<\/span>\u304c\u672c\u7814\u7a76\u5ba4\u6240\u5c5e\u3067\u3059\u3002<\/p>\n

\u5b66\u8853\u96d1\u8a8c\u63b2\u8f09\u8ad6\u6587 (Journals)<\/h3>\n
    \n
  1. K. Yao, H. Yano, and\u00a0\u00a0N. Iwamuro,\u00a0“Investigations of short-circuit failure in double trench SiC MOSFETs through three-dimensional electro-thermal-mechanical stress analysis,” Microelectronics Reliability<\/em>, Vol. 122, pp. 114163\/1-10, 2021,\u00a0DOI: 10.1016\/j.microrel.2021.114163<\/a>.<\/li>\n
  2. Hiroki Sakata<\/span>, Dai Okamoto<\/span>, Mitsuru Sometani, Mitsuo Okamoto, Hirohisa Hirai, Shinsuke Harada, Tetsuo Hatakeyama, Hiroshi Yano<\/span>, and Noriyuki Iwamuro<\/span>, “Accurate determination of threshold voltage shift during negative gate bias stress in 4H-SiC MOSFETs by fast on-the-fly method,” Japanese Journal of Applied Physics<\/em>, vol.60, pp. 060901\/1-4, 2021, DOI:10.35848\/1347-4065\/abff38<\/a>.<\/li>\n
  3. C. Huang, J. Zhang, T. Mannen and T. Isobe, “Efficiency improvement with off-time discrete control for GaN-based MHz-operated discontinuous current mode grid-tied inverter,” in\u00a0IEEE Transactions on Industry Applications<\/em>, vol. 57, no. 5, pp. 5108-5116, Sept.-Oct. 2021, DOI: 10.1109\/TIA.2021.3093254.<\/a><\/li>\n
  4. K. Itoh<\/span>, R. Barrera-Cardenas<\/span>,\u00a0 M. Ishigaki, T. Sugiyama, T. Isobe<\/span>, and H. Tadano<\/span>, “Analysis and Design of a Single-Stage Isolated DC\/AC Converter for a High-Power-Density Onboard AC Inverter,” IEEJ Transaction on Electrical and Electronic Engineering, vol. 17, pp.120-131, Jan. 2022,\u00a0 <\/em>DOI:10.1002\/tee.23494<\/a>.<\/em><\/li>\n
  5. K. Yao, H. Yano and N. Iwamuro, “Impact of Negative Gate Bias and Inductive Load on the Single-Pulse Avalanche Capability of 1200-V SiC Trench MOSFETs,” in\u00a0IEEE Transactions on Electron Devices<\/em>, vol. 69, no. 2, pp. 637-643, Feb. 2022, doi: 10.1109\/TED.2021.3133201.<\/li>\n
  6. C. Zhang, T. Isobe<\/span>, J. A. Suul, T. Dragi\u010devi\u0107 and M. Molinas, “Parametric Stability Assessment of Single-Phase Grid-Tied VSCs Using Peak and Average DC Voltage Control,” in IEEE Transactions on Industrial Electronics<\/em>, vol. 69, no. 3, pp. 2904-2915, March 2022, DOI: 10.1109\/TIE.2021.3068551<\/a>.<\/li>\n
  7. M. Li, R. Iijima, T. Mannen, T. Isobe and H. Tadano, “New Modulation for Z-Source Inverters With Optimized Arrangement of Shoot-Through State for Inductor Volume Reduction,” in IEEE Transactions on Power Electronics<\/em>, vol. 37, no. 3, pp. 2573-2582, March 2022, DOI: 10.1109\/TPEL.2021.3109672<\/a>.<\/li>\n
  8. \u8a31 \u822a, \u91ce\u6751 \u65b0\u4e00, \u78ef\u90e8 \u9ad8\u7bc4<\/span>, \u529b\u77f3 \u6d69\u5b5d, \u7b52\u4e95 \u5e83\u660e, “\u5e83\u3044\u30a8\u30a2\u30ae\u30e3\u30c3\u30d7\u304c\u3042\u308b\u78c1\u5fc3\u96fb\u78c1\u77f3\u306e\u81ea\u5df1\u30a4\u30f3\u30c0\u30af\u30bf\u30f3\u30b9\u6982\u7b97\u6cd5, “\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8c\uff24\uff08\u7523\u696d\u5fdc\u7528\u90e8\u9580\u8a8c\uff09, vol. 141, no. 11, pp. 912-920, 2021, DOI: 10.1541\/ieejias.141.912<\/a><\/li>\n
  9. H. Zhang, T. Isobe, “An Improved Charge-Based Method Extended to Estimating Appropriate Dead Time for Zero-Voltage-Switching Analysis in Dual-Active-Bridge Converter,” in Energies<\/em>, vol. 15, issue. 2, 671, March 2022, DOI: 10.3390\/en15020671.<\/a><\/li>\n<\/ol>\n

    \u5b66\u4f1a\u30fb\u7814\u7a76\u4f1a\u767a\u8868\uff08\u56fd\u969b\u5b66\u4f1a\uff09(Proceedings – International)<\/h3>\n
      \n
    1. K. Matsui<\/span>,\u00a0R. Aiba<\/span>, M. Baba, S. Harada, H. Yano<\/span>, and N. Iwamuro<\/span>, “Comprehensive Study on Electrical Characteristics in 1.2 kV SiC SBD-integrated Trench and Planar MOSFETs” in\u00a0Proc. of Int. Symp. Power Semiconductors and ICs (ISPSD 2021),\u00a0<\/em>pp. 215-218, 2021.<\/li>\n
    2. K. Yao, H. Yano, and N. Iwamuro,\u00a0“Investigations of UIS Failure Mechanism in 1.2 kV Trench SiC MOSFETs Using Electro-Thermal-Mechanical Stress Analysis” in\u00a0Proc. of Int. Symp. Power Semiconductors and ICs (ISPSD 2021)<\/em>,\u00a0<\/em>pp. 115-118, 2021.<\/li>\n
    3. S. Todaka<\/span>, K. Matsui<\/span>, R. Aiba<\/span>, M. Baba, S. Harada, H. Yano<\/span>, and N. Iwamuro<\/span>, “Experimental and Numerical Demonstration of Superior RBSOAs in 1.2kV SiC Trench and SBD-integrated Trench MOSFETs” in\u00a0Proc. of Int. Symp. Power Semiconductors and ICs (ISPSD 2021)<\/em>,\u00a0<\/em>pp. 219-222, 2021.<\/li>\n
    4. \n
      C. Huang, T. Mannen and T. Isobe, “Improved Off-Time Discrete Control for DCM Grid-Tied Inverter with Accurate Average Current Model and considering Nonlinear Parasitic Capacitance,”2021 IEEE ENERGY CONVERSION CONGRESS (ECCE 2021)<\/em>, Oct, 2021. DOI: 10.1109\/ECCE47101.2021.9595522<\/a><\/div>\n<\/li>\n
    5. S. Miyahara, T. Mannen and T. Isobe, A. Niwa, H. Akiyama, “Development of an output characteristics measuring platform for high voltage and large current of power devices and calculation of switching waveforms utilizing the measured values ,”2021 IEEE International Future Energy Electronics Conference (IFEEC 2021)<\/em>, Nov, 2021. DOI: 10.1109\/IFEEC53238.2021.9661695<\/a><\/li>\n
    6. R. Shimada, C. Huang, T. Mannen and T. Isobe, “Unipolar\/Bipolar Mixed Modulation for Discontinuous Current Mode Single-phase Grid-tied Inverter with Off-time Discrete Control ,”2021 IEEE International Future Energy Electronics Conference (IFEEC 2021)<\/em>, Nov, 2021. DOI: 10.1109\/IFEEC53238.2021.9661896<\/a><\/li>\n
    7. C. Lou, T. Mannen and T. Isobe, “Charging Current Control for Capacitor Discharge Type Pulse Voltage Generator by Using Partial Rated Converter,” 2021 IEEE International Future Energy Electronics Conference (IFEEC 2021)<\/em>, Nov, 2021. DOI: 10.1109\/IFEEC53238.2021.9661993<\/a><\/li>\n
    8. \n
      H. Zhang, T. Isobe and T. Mannen, “Back-to-back geometrical configuration of two parallel-connected double-sided cooling modules for parasitic inductance reduction,” 2022 IEEE Applied Power Electronics Conference and Exposition (APEC)<\/em>, Houston, TX, USA, 2022, pp. 336-341. DOI: 10.1109\/APEC43599.2022.9773488<\/a><\/div>\n<\/li>\n<\/ol>\n

      \u5b66\u4f1a\u30fb\u7814\u7a76\u4f1a\u767a\u8868\uff08\u56fd\u5185\uff09(Proceedings – Domestic)<\/h3>\n
        \n
      1. \u5bae\u539f\u3000\u99ff\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u2fbc\u7bc4\uff0c\u201c\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u9ad8\u96fb\u5727\u30fb\u5927\u96fb\u6d41\u57df\u306b\u304a\u3051\u308b\u51fa\u529b\u7279\u6027\u6e2c\u5b9a\u88c5\u7f6e\u306e\u958b\u767a\u3068\u305d\u306e\u6e2c\u5b9a\u5024\u3092\u6d3b\u7528\u3057\u305f\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u6ce2\u5f62\u7b97\u51fa\u201d\uff0c2021\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u9577\u5ca1\uff0c2021\u5e748\u670825\u65e5\uff5e27\u65e5<\/li>\n
      2. \u6fa4\u7530\u9ad8\u5fd7\uff0c\u53ea\u91ce\u3000\u535a\uff0c\u5869\u5d0e\u5b8f\u53f8\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u201cGaN\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u642d\u8f09\u30a4\u30f3\u30d0\u30fc\u30bf\u57fa\u677f\u306e\u30d0\u30b9\u30d0\u30fc\u51b7\u5374\u69cb\u9020\u306b\u3088\u308b\u9ad8\u653e\u71b1\u6027\u3068\u30b2\u30fc\u30c8\u30a4\u30f3\u30c0\u30af\u30bf\u30f3\u30b9\u4f4e\u6e1b\u201d\uff0c2021\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u9577\u5ca1\uff0c2021\u5e748\u670825\u65e5\uff5e27\u65e5<\/li>\n
      3. \u53ea\u91ce\u3000\u535a\uff0c\u6fa4\u7530\u9ad8\u5fd7\uff0c\u5869\u5d0e\u5b8f\u53f8\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u201cp-GaN\u30b2\u30fc\u30c8\u6a2a\u578b\u30c8\u30e9\u30f3\u30b8\u30b9\u30bf\u306e\u77ed\u7d61\u8010\u91cf\u8a55\u4fa1\u201d\uff0c2021\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u9577\u5ca1\uff0c2021\u5e748\u670826\u65e5<\/li>\n
      4. Huang Cheng\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u2fbc\u7bc4\uff0c\u201c\u96e2\u6563\u578b\u30aa\u30d5\u30bf\u30a4\u30e0\u5236\u5fa1\u3092\u7528\u3044\u305fDCM\u7cfb\u7d71\u9023\u7cfb\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u30bb\u30f3\u30b5\u30ec\u30b9\u96fb\u6d41\u5236\u5fa1\u306b\u304a\u3051\u308b\u8efd\u8ca0\u8377\u6642\u96fb\u6d41\u6b6a\u307f\u306e\u4f4e\u6e1b\u201d\uff0c\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\/\u30e2\u30fc\u30bf\u30c9\u30e9\u30a4\u30d6\u5408\u540c\u7814\u7a76\u4f1a\uff0c\u5ddd\u8d8a\uff0c2021\u5e749\u670817\u65e5<\/li>\n
      5. \u4e0a\u6749\u4fca\u592a\u90ce\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u2fbc\u7bc4\uff0c\u201c\u78c1\u6c17\u7d50\u5408\u30a4\u30f3\u30c0\u30af\u30bf\u3092\u5229\u7528\u3057\u305f\u30a4\u30f3\u30bf\u30fc\u30ea\u30fc\u30d6\u65b9\u5f0f\u96fb\u6d41\u4e0d\u9023\u7d9a\u30e2\u30fc\u30c9\u7cfb\u7d71\u9023\u7cfb\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u5b9f\u6a5f\u691c\u8a3c\u201d\uff0c\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\/\u30e2\u30fc\u30bf\u30c9\u30e9\u30a4\u30d6\u5408\u540c\u7814\u7a76\u4f1a\uff0c\u5ddd\u8d8a\uff0c2021\u5e749\u670817\u65e5<\/li>\n
      6. \u68ee\u6d77\u6597\uff0c\u4e80\u548c\u7530\u4eae\uff0c\u5ca9\u5ba4\u61b2\u5e78\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u300c4H-SiC\u30b7\u30e7\u30c3\u30c8\u30ad\u30fcpn\u30c0\u30a4\u30aa\u30fc\u30c9\u306e\u6700\u9069\u8a2d\u8a08\u691c\u8a0e\u3068\u52d5\u4f5c\u89e3\u6790\u300d\uff0c\u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u3000\u7b2c8\u56de\u8b1b\u6f14\u4f1a\uff0c2021\u5e7412\u67089\u65e5\uff5e12\u670810\u65e5<\/li>\n
      7. \u897f\u57ce\u667a\u54c9\uff0c\u5ca9\u5ba4\u61b2\u5e78\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u201c\u30e2\u30ce\u30ea\u30b7\u30c3\u30af\u76f8\u88dc\u578b\u96fb\u529b\u5909\u63db\u5668\u306b\u5411\u3051\u305f4H-SiC RESURF p-MOSFET\u306e\u6700\u9069\u8a2d\u8a08\u306e\u691c\u8a0e\u201c\uff0c\u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u3000\u7b2c\uff18\u56de\u8b1b\u6f14\u4f1a\uff0c2021\u5e7412\u67089\u65e5<\/li>\n
      8. \u5742\u7530\u5927\u8f1d\uff0c\u5ca1\u672c\u5927\uff0c\u67d3\u8c37\u6e80\uff0c\u5e73\u4e95\u60a0\u4e45\uff0c\u5ca1\u672c\u5149\u592e\uff0c\u539f\u7530\u4fe1\u4ecb\uff0c\u7560\u5c71\u54f2\u592b\uff0c\u77e2\u91ce \u88d5\u53f8\uff0c\u5ca9\u5ba4 \u61b2\u5e78,\u3000\u300c\u6539\u826f\u9ad8\u901fOn-the-fly\u6cd5\u306b\u3088\u308bSiC MOSFET\u306eNBTI\u8a55\u4fa1\u300d,\u3000\u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u3000\u7b2c8\u56de\u8b1b\u6f14\u4f1a\uff0c2021\u5e7412\u67089\u65e5\uff5e12\u670810\u65e5<\/li>\n
      9. Huang Cheng\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u2fbc\u7bc4\uff0c\u201c\u96e2\u6563\u578b\u30aa\u30d5\u30bf\u30a4\u30e0\u5236\u5fa1\u3092\u7528\u3044\u305fZVS \u53ef\u80fd\u306aDCM\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u9ad8\u52b9\u7387\u5316\u306b\u5411\u3051\u305f\u96fb\u6d41\u30ea\u30c3\u30d7\u30eb\u306e\u4f4e\u6e1b\u6cd5\u201d\uff0c\u96fb\u529b\u6280\u8853\u30fb\u96fb\u529b\u7cfb\u7d71\u6280\u8853\u30fb\u534a\u5c0e\u4f53\u96fb\u529b\u5909\u63db\u5408\u540c\u7814\u7a76\u4f1a\uff0c\u58f1\u5c90\uff0c2022\u5e743\u670810\u65e5\uff5e11\u65e5<\/li>\n
      10. \u79cb\u8449\u6df3\u5b8f\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u300c3\u30ec\u30d9\u30eb\u30c1\u30e3\u30fc\u30b8\u30dd\u30f3\u30d4\u30f3\u30b0\u6cd5\u3092\u7528\u3044\u305fSiC MOSFET\u306e\u754c\u9762\u6b20\u9665\u5206\u5e03\u306e\u691c\u8a0e\u300d\uff0c\u7b2c69\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\uff0c2022\u5e743\u670822~26\u65e5<\/li>\n
      11. \u68ee\u6d77\u6597\uff0c\u4e80\u548c\u7530\u4eae\uff0c\u5ca9\u5ba4\u61b2\u5e78\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u300c4H-SiC\u30b7\u30e7\u30c3\u30c8\u30ad\u30fcpn\u30c0\u30a4\u30aa\u30fc\u30c9\u306e\u5c0e\u96fb\u6a5f\u69cb\u89e3\u6790\u300d\uff0c\u7b2c69\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\uff0c2022\u5e743\u670822~26\u65e5<\/li>\n
      12. \u9ad8\u6a4b\u5149\u5e0c\uff0c\u67cf\u4f73\u4ecb\uff0c\u677e\u4e95\u30b1\u30d3\u30f3\uff0c\u77e2\u91ce\u88d5\u53f8\uff0c\u5ca9\u5ba4\u61b2\u5e78\uff0c\u300cTCAD\u30b7\u30df\u30e5\u30ec\u30fc\u30b7\u30e7\u30f3\u3092\u7528\u3044\u305f1.2kV SBD\u5185\u8535 SiC MOSFET\u306e\u96fb\u6c17\u7279\u6027\u89e3\u6790\u300d\uff0c\u4ee4\u548c4\u5e74\u5ea6\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a\uff0c2022\u5e743\u670821\u65e5\uff5e23\u65e5<\/li>\n<\/ol>\n

        \u4e00\u822c\u96d1\u8a8c\u63b2\u8f09\u8a18\u4e8b (Magazines)<\/h3>\n
          \n
        1. \u5ca9\u5ba4\u3000\u61b2\u5e78, “\u81ea\u52d5\u8eca\u96fb\u52d5\u5316\u3078\u5411\u3051\u305fSiC\/GaN \u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u6700\u65b0\u958b\u767a\u72b6\u6cc1\u3068\u8ab2\u984c”, \u6708\u520a\u8eca\u8f09\u30c6\u30af\u30ce\u30ed\u30b8\u30fc\u30019\u6708\u53f7,\u00a0 \u6280\u8853\u60c5\u5831\u5354\u4f1a.<\/span><\/li>\n
        2. Noriyuki Iwamuro, “Power ICs Shape Up to Meet Emerging Automobile Trends,” ASIA Electronics Industry, Vol. 26, No.303, pp.28-29, Dec., 2021.<\/li>\n
        3. \u5ca9\u5ba4\u3000\u61b2\u5e78, “SiC\u30fbGaN\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u306e\u6280\u8853\u52d5\u5411\u3068\u5fdc\u7528\u5c55\u958b,” \u5de5\u696d\u6750\u6599\u30002022\u3000\u51ac\u53f7,\u00a0 \u7b2c70\u5dfb\u3001\u7b2c1\u53f7, pp.2~7,\uff08\u4ee4\u548c4\u5e742\u67081\u65e5\u767a\u884c\uff09,\u3000\u65e5\u520a\u5de5\u696d\u65b0\u805e\u793e.<\/li>\n<\/ol>\n

          \u8b1b\u6f14 (Invited Lecture)<\/h3>\n
            \n
          1. \u59da\u3000\u51f1\u502b, “\u71b1\u5fdc\u529b\u89e3\u6790\u3092\u8003\u616e\u3057\u305fSiC-MOSFET\u7834\u58ca\u30e1\u30ab\u30cb\u30ba\u30e0\u306e\u7814\u7a76” , \uff08\u516c\uff09\u81ea\u52d5\u8eca\u6280\u8853\u4f1a\u3000\u7b2c8\u56de\u8eca\u8f09\u7528\u30d1\u30ef\u30fc\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u6280\u8853\u90e8\u9580\u59d4\u54e1\u4f1a, 2021\u5e749\u670830\u65e5.<\/li>\n
          2. \u5ca9\u5ba4\u3000\u61b2\u5e78, “Si\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u306e\u6700\u65b0\u6280\u8853\u3069\u6280\u8853\u8ab2\u984c\u201d,\u3000\uff08\u516c\uff09\u7cbe\u5bc6\u5de5\u5b66\u4f1a \u30d7\u30e9\u30ca\u30ea\u30bc\u30fc\u30b7\u30e7\u30f3 CMP \u3068\u305d\u306e\u5fdc\u7528\u6280\u8853\u5c02\u9580\u59d4\u54e1\u4f1a,\u7b2c193\u56de\u7814\u7a76\u4f1a, 2021\u5e7410\u67088\u65e5.<\/li>\n
          3. \u5ca9\u5ba4\u3000\u61b2\u5e78,\u00a0 \u00a0“\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u306e\u6700\u65b0\u52d5\u5411”, Advanced Metallization Conference 2021, Asia Session (ADMETA plus 2021), 30\u56de\u8a18\u5ff5\u8b1b\u6f14,\u30002021\u5e7410\u670813\u65e5.<\/li>\n<\/ol>\n

            \u66f8\u7c4d (Books)<\/h3>\n
              \n
            1. \u5ca9\u5ba4\u3000\u61b2\u5e78\u76e3\u4fee,\u3000\u201d\u6b21\u4e16\u4ee3\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u306e\u958b\u767a\u52d5\u5411\u3068\u5fdc\u7528\u5c55\u958b”,\u30b7\u30fc\u30a8\u30e0\u30b7\u30fc\u51fa\u7248, 2021\u5e748\u6708.\u7b2c1\u7ae0 1. \u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u306e\u73fe\u72b6\u30fb\u8ab2\u984c\u30fb\u5c55\u671b\uff08\u57f7\u7b46\uff1a\u5ca9\u5ba4\u61b2\u5e78\uff09,\u7b2c2\u7ae0 1. SiC\u534a\u5c0e\u4f53\uff08\u57f7\u7b46:\u77e2\u91ce\u88d5\u53f8\uff09, \u7b2c3\u7ae0 6. \u6b21\u4e16\u4ee3\u30d1\u30ef\u30fc\u30c7\u30d0\u30a4\u30b9\u3092\u7528\u3044\u305f\u96fb\u529b\u5909\u63db\u5668\u306e\u305f\u3081\u306e\u56de\u8def\u65b9\u5f0f\u3068\u8003\u3048\u65b9\uff08\u57f7\u7b46\uff1a\u78ef\u90e8\u9ad8\u7bc4\uff09.<\/li>\n<\/ol>\n\n\n

              <\/p>\n\n\n

              <\/p>\n

              <\/p>","protected":false},"excerpt":{"rendered":"\u8457\u8005\u306b\u4e0b\u7dda\u306e\u3042\u308b\u3082\u306e\u306f\u4ed6\u6a5f\u95a2\u6240\u5c5e\u306e\u8457\u8005\u3068\u306e\u5171\u8457\u306e\u3082\u306e\u3067\uff0c\u4e0b\u7dda\u306e\u8457\u8005\u304c\u672c\u7814\u7a76\u5ba4\u6240\u5c5e\u3067\u3059\u3002 \u5b66\u8853\u96d1\u8a8c\u63b2\u8f09\u8ad6\u6587 (Journals) K. Yao, H. Yano, and\u00a0\u00a0N. Iwamuro,\u00a0“Inves …","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/5517"}],"collection":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=5517"}],"version-history":[{"count":79,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/5517\/revisions"}],"predecessor-version":[{"id":6228,"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=\/wp\/v2\/pages\/5517\/revisions\/6228"}],"wp:attachment":[{"href":"http:\/\/power.bk.tsukuba.ac.jp\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=5517"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}