{"id":6744,"date":"2024-09-26T17:23:59","date_gmt":"2024-09-26T08:23:59","guid":{"rendered":"http:\/\/power.bk.tsukuba.ac.jp\/?page_id=6744"},"modified":"2025-07-26T21:42:18","modified_gmt":"2025-07-26T12:42:18","slug":"2024%e5%b9%b4%e5%ba%a6%e3%81%ae%e7%a0%94%e7%a9%b6%e6%a5%ad%e7%b8%be","status":"publish","type":"page","link":"http:\/\/power.bk.tsukuba.ac.jp\/?page_id=6744","title":{"rendered":"2024\u5e74\u5ea6\u306e\u7814\u7a76\u696d\u7e3e"},"content":{"rendered":"<p><\/p>\n\n\n<p>\u8457\u8005\u306b<span style=\"text-decoration: underline;\">\u4e0b\u7dda<\/span>\u306e\u3042\u308b\u3082\u306e\u306f\u4ed6\u6a5f\u95a2\u6240\u5c5e\u306e\u8457\u8005\u3068\u306e\u5171\u8457\u306e\u3082\u306e\u3067\uff0c<span style=\"text-decoration: underline;\">\u4e0b\u7dda\u306e\u8457\u8005<\/span>\u304c\u672c\u7814\u7a76\u5ba4\u6240\u5c5e\u3067\u3059\u3002<\/p>\n\n\n\n<h3>\u5b66\u8853\u96d1\u8a8c\u63b2\u8f09\u8ad6\u6587 (Journals)<\/h3>\n\n\n\n<ol><li><span style=\"text-decoration: underline;\">Kazuhiro Suzuki<\/span>, <span style=\"text-decoration: underline;\">Hiroshi Yano<\/span> and <span style=\"text-decoration: underline;\">Noriyuki<span style=\"text-decoration: underline;\"> Iwamuro<\/span><\/span>, &#8220;A study on turn-off, and on-resistance and short-circuit capability trade-off characteristics in 1.2 kV SiC MOSFETs,&#8221; 2024 <em>Japanese Journal of Applied Physics<\/em>, vol. 63, pp. 12SP10, Dec. 2024, <a href=\"https:\/\/iopscience.iop.org\/article\/10.35848\/1347-4065\/ad96c4\/meta\">DOI: 10.35848\/1347-4065\/ad96c4<\/a>.<\/li><li><span style=\"text-decoration: underline;\">Kazuhiro Suzuki<\/span>, <span style=\"text-decoration: underline;\">Kaito Kashimura<\/span>, <span style=\"text-decoration: underline;\">Hiroshi Yano<\/span> and <span style=\"text-decoration: underline;\">Noriyuki<span style=\"text-decoration: underline;\"> Iwamuro<\/span><\/span>, &#8220;Unique short-circuit failure mechanisms in 1.2-kV SiC planar MOSFETs,&#8221; 2024 <em>Applied Physics Express<\/em>, vol. 17, pp. 124002, Dec. 2024, <a href=\"https:\/\/iopscience.iop.org\/article\/10.35848\/1882-0786\/ad9980\/meta\">DOI: 10.35848\/1882-0786\/ad9980<\/a>.<\/li><li>\u6cb3\u91ce \u821c\u751f,\u00a0\u842c\u5e74 \u667a\u4ecb,\u00a0\u78ef\u90e8 \u9ad8\u7bc4,\u00a0\u300c\u76f4\u4ea4\u5316\u3055\u308c\u305f\u62e1\u5f35\u30af\u30e9\u30fc\u30af\u5909\u63db\u884c\u5217\u306b\u3088\u308b\u591a\u76f8\u96fb\u52d5\u6a5f\u8907\u6570\u76f8\u30aa\u30fc\u30d7\u30f3\u6545\u969c\u72b6\u614b\u306e\u96fb\u6d41\u5236\u5fa1\u300d,\u00a0\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8c\uff24\uff08\u7523\u696d\u5fdc\u7528\u90e8\u9580\u8a8c\uff09,\u00a0Vol. 144,\u00a0No. 7,\u00a0pp. 577-583 (2024), <a href=\"https:\/\/doi.org\/10.1541\/ieejias.144.577\">DOI: 10.1541\/ieejias.144.577<\/a><\/li><li><span style=\"text-decoration: underline;\">Haoyu Zhang<\/span>, <span style=\"text-decoration: underline;\">Takanori Isobe<\/span>, &#8220;A Verification of Applying Superjunction MOSFETs in Dual-Active-Bridge Converters Operated with Minimal RMS Current,&#8221; <em>IEEJ Journal of Industry Applications<\/em>, vol. 14, No. 2, pp. 240-249 (2025), <a href=\"https:\/\/doi.org\/10.1541\/ieejjia.24004235\">DOI: 10.1541\/ieejjia.24004235<\/a><\/li><\/ol>\n\n\n\n<h3>\u5b66\u4f1a\u30fb\u7814\u7a76\u4f1a\u767a\u8868\uff08\u56fd\u969b\u5b66\u4f1a\uff09(Proceedings &#8211; International)<\/h3>\n\n\n\n<ol><li><u>T. Mannen<\/u>, <u>B. Seo<\/u>, <u>T. Isobe<\/u> and N. Ha Pham, &#8220;Buck-Type Current Unfolding Converter With Discontinuous Conduction Mode in Ultra-Low Power-Factor Operation,&#8221;&nbsp;<em>PCIM Europe 2024; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management<\/em>, N\u00fcrnberg, Germany, 2024, pp. 831-836, <a href=\"https:\/\/doi.org\/10.30420\/566262101\">doi: 10.30420\/566262101<\/a>.<\/li><li><span style=\"text-decoration: underline;\">Kotaro Matsuki<\/span>, Yoshiito Ichikawa, Yuichi Onozawa, <span style=\"text-decoration: underline;\">Noriyuki Iwamuro<\/span> and <span style=\"text-decoration: underline;\">Hiroshi Yano<\/span>, \u201cImpact of electron irradiation on SiC power MOSFET performance\u201d&nbsp;<em>International Conference on SIlicon Carbide and Related Materials (ICSCRM)<\/em>, vol.8, pp 563-564, Raleigh, USA, Oct. 2024.<\/li><li>R. Shingo, Y. Enjoji, N. Iwamuro, and H. Yano, \u201cRelationship between Luminescence and Threshold Voltage Shift in SiC MOSFETs under Gate AC Stress\u201c <em>The 11th Asia-Pacific Workshop on Widegap Semiconductors (APWS 2024)<\/em>, MC2-3, Busan, Korea, Oct. 2024.<\/li><li>C. Huang, T. Mannen and T. Isobe, &#8220;Full-load Range ZVS Achievement by Using Both Burst Mode and PWM With Variable Frequency Modulation for DAB Converters,&#8221; <em>2024 IEEE Energy Conversion Congress &amp; Expo (ECCE2024)<\/em>, Phoenix, AZ, USA, Oct., 2024, pp. 2648-2655, <a rel=\"noreferrer noopener\" href=\"https:\/\/doi.org\/10.1109\/ECCE55643.2024.10860843\" target=\"_blank\">doi: 10.1109\/ECCE55643.2024.10860843<\/a><\/li><li>Y. Suzuki, C. Huang, T. Mannen and T. Isobe, &#8220;Efficiency Improvement of DAB Converter for Double Line Frequency Oscillating Power Operations in SST by Achieving Zero-Voltage Switching in Low Power Operations,&#8221; <em>2024 IEEE Energy Conversion Congress &amp; Expo (ECCE2024)<\/em>, Phoenix, AZ, USA, Oct., 2024, pp. 3159-3166, <a rel=\"noreferrer noopener\" href=\"https:\/\/doi.org\/10.1109\/ECCE55643.2024.10860944\" target=\"_blank\">doi: 10.1109\/ECCE55643.2024.10860944<\/a><\/li><li>T. Yoshizato, C. Huang, T. Mannen and T. Isobe, &#8220;500-kHz Operated Three-Phase Grid-Tied Inverter Using GaN-HEMTs Enabled by DCM-Based ZVS Control Utilizing Device Parasitic Capacitance,&#8221; <em>2024 IEEE Energy Conversion Congress &amp; Expo (ECCE2024)<\/em>, Phoenix, AZ, USA, Oct., 2024, pp. 3357-3363, <a rel=\"noreferrer noopener\" href=\"https:\/\/doi.org\/10.1109\/ECCE55643.2024.10861050\" target=\"_blank\">doi: 10.1109\/ECCE55643.2024.10861050<\/a><\/li><li><span style=\"text-decoration: underline;\">Kazuhiro Suzuki<\/span>, <span style=\"text-decoration: underline;\">Hiroshi Yano<\/span> and <span style=\"text-decoration: underline;\">Noriyuki<span style=\"text-decoration: underline;\"> Iwamuro<\/span><\/span>, \u201cA Study of Electrical Characteristics of State-of-the-Art 1.2-kV SiC Planar and Trench MOSFETs\u201d&nbsp;<em>International Conference on Solid State Devices and Materials (SSDM)<\/em>, Himeji, Japan, Sept. 2024, pp.221-222.<\/li><li>T. Isobe, C. Huang and T. Mannen, &#8220;Design and Control Strategy of DAB Converter with 3.3 kV SiC-MOSFETs for SSTs,&#8221;&nbsp;<em>2024 13th International Conference on Renewable Energy Research and Applications (ICRERA)<\/em>, Nagasaki, Japan, Nov. 2024, pp. 1834-1839, <a href=\"https:\/\/doi.org\/10.1109\/ICRERA62673.2024.10815213\">doi: 10.1109\/ICRERA62673.2024.10815213<\/a>.<\/li><li>T. Mannen, &#8220;Fault-Ride-Through Operation of Solid-state-Transformer Equipped with Ultra Small Capacitors in H-Bridge Cells,&#8221;&nbsp;<em>2024 13th International Conference on Renewable Energy Research and Applications (ICRERA)<\/em>, Nagasaki, Japan, Nov. 2024, pp. 1840-1843, <a href=\"https:\/\/doi.org\/10.1109\/ICRERA62673.2024.10815268\">doi: 10.1109\/ICRERA62673.2024.10815268<\/a>.<\/li><li>Tomoya Ide, Yuko Hirase, <u>Cheng Huang<\/u>, <u>Takanori Isobe<\/u>, &#8220;Online Impedance-based Analysis for Power System Stability Assessment Using Transformer-less and Filter-less Switch-Mode Perturbation Generator,&#8221;<em> IEEE Applied Power Electronics Conference and Exposition (APEC 2025)<\/em>, Atlanta, GA, USA, March 2025.<\/li><\/ol>\n\n\n\n<h3>\u5b66\u4f1a\u30fb\u7814\u7a76\u4f1a\u767a\u8868\uff08\u56fd\u5185\uff09(Proceedings &#8211; Domestic)<\/h3>\n\n\n\n<ol><li>\u4e95\u624b\u667a\u4e5f\uff0c\u6c38\u4e95\u4e00\u771f\uff0c\u8352\u6728\u4e00\u53f8\uff0c\u5e73\u702c\u7950\u5b50\uff0c<span style=\"text-decoration: underline;\">\u78ef\u90e8\u9ad8\u7bc4<\/span>\uff0c\u300c\u30d5\u30a3\u30eb\u30bf\u30ec\u30b9\u30a4\u30f3\u30d0\u30fc\u30bf\u3092\u6442\u52d5\u96fb\u6e90\u3068\u3059\u308b\u30a4\u30f3\u30d4\u30fc\u30c0\u30f3\u30b9\u8a08\u6e2c\u88c5\u7f6e\u958b\u767a\u306b\u95a2\u3059\u308b\u7814\u7a76\u300d\uff0c2024\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u6c34\u6238\u5e02\u6c11\u4f1a\u9928\uff0c2024\u5e748\u670828\u65e5\u301c30\u65e5<\/li><li>Cheng Huang\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u300c\u30d1\u30eb\u30b9\u5e45\u5236\u5fa1\u3068\u9593\u6b20\u904b\u8ee2\u3092\u4f75\u7528\u3057\u5168\u8ca0\u8377\u7bc4\u56f2\u3067\u306e\u30bc\u30ed\u96fb\u5727\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u3092\u5b9f\u73fe\u3059\u308b DAB \u30b3\u30f3\u30d0\u30fc\u30bf\u5909\u8abf\u65b9\u5f0f\u306e\u63d0\u6848\u3068\u305d\u306e\u904b\u8ee2\u30b7\u30ca\u30ea\u30aa\u306e\u691c\u8a0e\u300d\uff0c2024\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u6c34\u6238\u5e02\u6c11\u4f1a\u9928\uff0c2024\u5e748\u670828\u65e5\u301c30\u65e5<\/li><li><span style=\"text-decoration: underline;\">\u842c\u5e74\u667a\u4ecb<\/span>\uff0c\u30d5\u30a1\u30e0\u30cf\u30fc\uff0c\u300c\u96fb\u5727\u5236\u5fa1\u3092\u9069\u7528\u3057\u305f\u6607\u5727\u5f62\u4e09\u76f8\u6ce2\u5f62\u7d44\u307f\u66ff\u3048\u30a4\u30f3\u30d0\u30fc\u30bf\u306e\u5b9f\u9a13\u691c\u8a3c\u300d\uff0c2024\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u6c34\u6238\u5e02\u6c11\u4f1a\u9928\uff0c2024\u5e748\u670828\u65e5\u301c30\u65e5<\/li><li>\u9234\u6728\u967d\u592a\uff0cCheng Huang\uff0c\u842c\u5e74\u667a\u4ecb\uff0c\u78ef\u90e8\u9ad8\u7bc4\uff0c\u300cSST \u306b\u9069\u7528\u3059\u308b\u96fb\u6e90 2 \u500d\u5468\u6ce2\u6570\u3067\u4f1d\u9001\u96fb\u529b\u3092\u8108\u52d5\u3055\u305b\u308b DAB \u30b3\u30f3\u30d0\u30fc\u30bf\u306e\u8efd\u8ca0\u8377\u9818\u57df\u3067\u306e\u30bc\u30ed\u96fb\u5727\u30b9\u30a4\u30c3\u30c1\u30f3\u30b0\u5b9f\u73fe\u306b\u3088\u308b\u52b9\u7387\u5411\u4e0a\u300d\uff0c2024\u5e74\u96fb\u6c17\u5b66\u4f1a\u7523\u696d\u5fdc\u7528\u90e8\u9580\u5927\u4f1a\uff0c\u6c34\u6238\u5e02\u6c11\u4f1a\u9928\uff0c2024\u5e748\u670828\u65e5\u301c30\u65e5<\/li><li><span style=\"text-decoration: underline;\">\u677e\u6728\u5eb7\u592a\u90ce<\/span>, \u5e02\u5ddd\u7fa9\u4eba, \u5c0f\u91ce\u6fa4\u52c7\u4e00, <span style=\"text-decoration: underline;\">\u5ca9\u5ba4\u61b2\u5e78<\/span>, <span style=\"text-decoration: underline;\">\u77e2\u91ce\u88d5\u53f8<\/span>, \u300c\u96fb\u5b50\u7dda\u7167\u5c04\u304cSiC\u304a\u3088\u3073Si MOSFET\u306e\u30c1\u30e3\u30cd\u30eb\u7279\u6027\u306b\u53ca\u307c\u3059\u5f71\u97ff\u300d, \u7b2c85\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u79cb\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a, 19p-C41-13, \u6731\u9dfa\u30e1\u30c3\u30bb, 2024\u5e749\u670816\u65e5\uff5e20\u65e5<\/li><li><span style=\"text-decoration: underline;\">\u677e\u6728\u5eb7\u592a\u90ce<\/span>, \u5e02\u5ddd\u7fa9\u4eba, \u5c0f\u91ce\u6fa4\u52c7\u4e00, <span style=\"text-decoration: underline;\">\u5ca9\u5ba4\u61b2\u5e78<\/span>, <span style=\"text-decoration: underline;\">\u77e2\u91ce\u88d5\u53f8<\/span>, \u300c\u96fb\u5b50\u7dda\u7167\u5c04\u304cSiC\u30d1\u30ef\u30fcMOSFET\u306e\u30c1\u30e3\u30cd\u30eb\u7279\u6027\u306b\u4e0e\u3048\u308b\u5f71\u97ff\u300d, \u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u7b2c11\u56de\u8b1b\u6f14\u4f1a, IA-17, G\u30e1\u30c3\u30bb\u7fa4\u99ac, 2024\u5e7411\u670824\u65e5\uff5e26\u65e5<\/li><li>\u65b0\u90f7\u8ad2\u4ecb, \u5186\u57ce\u5bfa\u4f51\u54c9, \u5ca9\u5ba4\u61b2\u5e78, \u77e2\u91ce\u88d5\u53f8, \u300cSiC MOSFET\u3078\u306e\u30b2\u30fc\u30c8AC\u30b9\u30c8\u30ec\u30b9\u5370\u52a0\u306b\u3088\u308b\u767a\u5149\u3068\u3057\u304d\u3044\u5024\u96fb\u5727\u5909\u52d5\u300d, \u7b2c85\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u79cb\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a, 19p-C41-22, \u6731\u9dfa\u30e1\u30c3\u30bb, 2024\u5e749\u670816\u65e5\uff5e20\u65e5<\/li><li>\u65b0\u90f7\u8ad2\u4ecb, \u5186\u57ce\u5bfa\u4f51\u54c9, \u5ca9\u5ba4\u61b2\u5e78, \u77e2\u91ce\u88d5\u53f8, \u300cSiC MOSFET\u3078\u306e\u30b2\u30fc\u30c8AC\u30b9\u30c8\u30ec\u30b9\u5370\u52a0\u6642\u306e\u767a\u5149\u3068\u3057\u304d\u3044\u5024\u96fb\u5727\u5909\u52d5\u306e\u95a2\u4fc2\u300d, \u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u7b2c11\u56de\u8b1b\u6f14\u4f1a, IA-11, G\u30e1\u30c3\u30bb\u7fa4\u99ac, 2024\u5e7411\u670824\u65e5\uff5e26\u65e5<\/li><li>\u5409\u7530\u958b, \u5ca9\u5ba4\u61b2\u5e78, \u77e2\u91ce\u88d5\u53f8, \u300c4H-SiC\u6a2a\u578bp-ch SJ-MOSFET\u306e\u9ad8\u6e29\u72b6\u614b\u306b\u304a\u3051\u308b\u6027\u80fd\u6539\u5584\u300d, \u5148\u9032\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5206\u79d1\u4f1a\u7b2c11\u56de\u516c\u6f14, IA-15, G\u30e1\u30c3\u30bb\u7fa4\u99ac, 2024\u5e7411\u670824\u65e5\uff5e26\u65e5<\/li><li>\u5b50\u5b89\u8475, \u65b0\u90f7\u8ad2\u4ecb, \u5ca9\u5ba4\u61b2\u5e78, \u77e2\u91ce\u88d5\u53f8, \u300cSiC MOSFET\u306b\u304a\u3051\u308bAC-BTI\u306e\u7a92\u5316\u6642\u9593\u4f9d\u5b58\u6027\u300d, \u7b2c72\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a, \u6771\u4eac\u7406\u79d1\u5927\u5b66\u91ce\u7530\u30ad\u30e3\u30f3\u30d1\u30b9, 16a-K301-3, 2025\u5e743\u670814\u65e5\uff5e17\u65e5<\/li><li>\u9e7f\u5fd7\u6751\u5feb\u97f3, \u9234\u6728\u4e00\u5e83, \u77e2\u91ce\u88d5\u53f8, \u5ca9\u5ba4\u61b2\u5e78, \u300c\u4f4e\u76f4\u6d41\u96fb\u5727\u5370\u52a0\u6642\u306b\u304a\u3051\u308bSiC MOSFET\u8ca0\u8377\u77ed\u7d61\u7834\u58ca\u30e1\u30ab\u30cb\u30ba\u30e0\u306e\u89e3\u6790\u300d, \u7b2c72\u56de\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a, \u6771\u4eac\u7406\u79d1\u5927\u5b66\u91ce\u7530\u30ad\u30e3\u30f3\u30d1\u30b9, 16a-K301-4, 2025\u5e743\u670814\u65e5\uff5e17\u65e5<\/li><li>\u963f\u90e8\u6d38\u592a, \u77e2\u91ce\u88d5\u53f8, \u5ca9\u5ba4\u61b2\u5e78, \u300cSiC SBD \u9ad8\u6e29\u30fb\u9ad8\u6e7f\u30d0\u30a4\u30a2\u30b9\u8a66\u9a13\u5f8c\u306e\u5468\u8fba\u8010\u5727\u9818\u57df\u89e3\u6790\u300d,\u4ee4\u548c7\u5e74\u96fb\u6c17\u5b66\u4f1a\u5168\u56fd\u5927\u4f1a,\u660e\u6cbb\u5927\u5b66\u4e2d\u91ce\u30ad\u30e3\u30f3\u30d1\u30b9,2025\u5e743\u670818\u65e5\uff5e20\u65e5<\/li><\/ol>\n\n\n\n<h3>\u4e00\u822c\u96d1\u8a8c\u63b2\u8f09\u8a18\u4e8b (Magazines)<\/h3>\n\n\n<p><\/p>\n<p><\/p>","protected":false},"excerpt":{"rendered":"\u8457\u8005\u306b\u4e0b\u7dda\u306e\u3042\u308b\u3082\u306e\u306f\u4ed6\u6a5f\u95a2\u6240\u5c5e\u306e\u8457\u8005\u3068\u306e\u5171\u8457\u306e\u3082\u306e\u3067\uff0c\u4e0b\u7dda\u306e\u8457\u8005\u304c\u672c\u7814\u7a76\u5ba4\u6240\u5c5e\u3067\u3059\u3002 \u5b66\u8853\u96d1\u8a8c\u63b2\u8f09\u8ad6\u6587 (Journals) Kazuhiro Suzuki, Hiroshi Yano and Noriyuki Iwa 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